TY  - CONF
AU  - Wardzińska Agnieszka
AU  - Bandurski Wojciech
JO  - 7th IEEE International Conference on Signals and Electronic Systems
TI  - Step Response to Sensitivity to RLC Parametres of VLSI Interconnect
T2  - 7th IEEE International Conference on Signals and Electronic Systems
PY  - 2010
Y1  - 7-10 September 2010
JA  - 7th IEEE International Conference on Signals and Electronic Systems
DO  - 
ER  -